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UV-SEM Analysis of Cobalt-Doped Titanium Dioxide Thin Films as Solar Cell Components Master of Science Education Program, University of Mataram, Lombok, West Nusa Tenggara, Indonesia 1,2,3, Abstract Research has been carried out in the form of the synthesis and characterization of thin films of Titanium Dioxide with the addition of Cobalt doping. The purpose of this research was to synthesize and characterize thin films related to optical properties, morphological shapes, and components of thin film compounds that are good for use as basic materials for the development of nanoparticle technology in the form of solar cells. The research was carried out in two stages, namely synthesis, such as preparation of glass substrates, preparation of sol-gel solutions, deposition of solutions onto glass substrates, and heating of TiO2: Co thin film samples. The next stage is the thin film characterization test, where the optical properties of the thin film, such as absorbance, transmittance, gap energy, and activation energy, are measured using a UV-Vis Spectrophotometer, while morphological data and components of the thin layer compounds are measured using a Scanning Electron Microscope-Energy Dispersive X-Ray (SEM-EDS). Based on data analysis and discussion, it was found that optical properties such as the maximum absorbance value of the TiO2:Co thin film were in the region with a wavelength of 280-295 nm with a value of 5.70 to 6.31. The greater the doping concentration, the greater the absorbance value. This condition is inversely proportional to the transmittance value of the thin film, which experiences the lowest point at a wavelength of 250-350 nm with a maximum percentage value of 62.14 to 78.85%. The greater the doping concentration, the lower the transmittance value. The energy band gap values of TiO2:Co thin films for doping concentrations (0, 5, 10, 15, 20)% were 3.47- 3.38- 3.37- 3.15- and 3.08 eV for the direct energy bandgap and 3.86- 3.84- 3.81- 3.81- and 3.75 eV for the indirect energy gap. The activation energy of the TiO2:Co thin film decreased from 2.86 to 2.28 eV. As for the morphological data of the TiO2:Co thin film, it was found that the greater the concentration of doping, the layer was deposited evenly, finely and homogeneously. Regarding the data on the components of the thin layer compounds, it was found that the percentage of TiO2 content was in the range of 60.48-95.94%, while for Co, it was in the range of 0-8.11%. This research data can be recommended as information for the development of solar cell technology. Keywords: Thin Films, Titanium Dioxide, Cobalt Doping, Optical Properties, Morphology, Solar Cell Technology, UV-Vis Spectrofometer, Scanning Electron Microscope-Energy Dispersive X-Ray. Topic: Education for sustainable development |
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